At Chipmetrics, we provide innovative metrology chips and wafers for semiconductor process control.
The applications of our cutting-edge solutions are in thin film process development, tool qualification, and quality assurance across semiconductor and advanced material manufacturing.
We are a leading expert in conformality measurements for thin films by using 3D high aspect ratio test elements.
High aspect ratio structures, new materials, and tighter geometries are challenges to semiconductor suppliers for process tools, materials, and inspection and test to meet the complex requirements of 3D.
We provide productized test chips and wafers and their analysis expertise for demanding 3D applications of thin films.
Our experts help you to get conformality information fast and accurately
Chipmetrics is a leader in the semiconductor 3D metrology, offering cutting-edge solutions for process control through its innovative test chips and wafers.
Our core technologies provide a new perspective in measuring 3D thin films within high aspect ratio device architectures, enabling precise and rapid assessments crucial for development and manufacturing.
We specialize in assisting our clients to develop new materials, optimize deposition processes, and enhance overall yields, significantly accelerating their time to market.
ISO 9001:2015 compliant. IC cleanliness certified
Country of origin: Finland, EU
Registered exporter FIREX31010316
Address: Yliopistokatu 7, Photonics center
80130, Joensuu, Finland
phone: +358 10 348 1344
E-mail: [email protected]
LATEST NEWS AND UPDATES