Chipmetrics to Premiere PillarHall LHAR5 Test Chips for Japanese Clients at SEMICON Japan
Finnish 3D semiconductor metrology expert aims to deepen relationships with Japanese companies at SEMICON Japan 2024 trade show. Joensuu, Finland/Tokyo, Japan – December 5th, 2024 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, announces its participation at SEMICON Japan to be held December 11–13 in Tokyo. At SEMICON Japan, Chipmetrics will […]
Chipmetrics at SEMICON Taiwan
Finnish 3D thin film semiconductor metrology specialist to bring its solutions to the Taiwanese semiconductor industry Joensuu, Finland/Taipei, Taiwan – August 21th, 2024 – Chipmetrics Oy, a leading provider of metrology solutions for the semiconductor industry, announces its participation at SEMICON Taiwan, held September 3–6. With it, Chipmetrics will bring its latest metrology solutions, including its […]
Chipmetrics at ALD2024
Finnish 3D thin film semiconductor metrology specialist to feature heavily at ALD/ALE 2024, celebrating the 50th year of ALD. Joensuu/Helsinki, Finland – July 25th, 2024 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, announces its presence and activities at the ALD/ALE 2024 conference, to be held in Helsinki, August 4–7. The event will […]
PillarHall LHAR Structures at the Forefront of ALD/ALE2024 Conference
The ALD/ALE2024 conference is showcasing the PillarHall Lateral High Aspect Ratio (LHAR) test structure in numerous pivotal presentations this year. This trend underscores the importance and versatility of PillarHall structure in pushing the boundaries of conformality research and ALD technology. Key Presentations Featuring PillarHall Structures Unveiling ALD Reaction MechanismsDr. Jussi Kinnunen will discuss the influence […]
Metrology solution provider Chipmetrics to attend SEMICON West 2024
Finnish 3D metrology specialist to feature in Optoprofiler’s booth in San Francisco’s Moscone Center Joensuu, Finland/San Francisco, USA – July 1st, 2024 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, announces its participation at SEMICON West 2024 in cooperation with distributor Optoprofiler. In Optoprofiler’s booth 164, visitors are invited to view the latest […]
Chipmetrics unveils 300 mm product line at APCM Europe 2024
The next evolution of metrology wafers and PillarHall will be demonstrated at the Chipmetrics booth in Hamburg, April 16–18. Joensuu, Finland – April 4th, 2024 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, will premiere its new ALD/CVD (Atomic Layer Deposition/Chemical Vapor Deposition) conformality test tools for 300-millimeter processes at APCM Europe. […]
Chipmetrics from Finland to Attend JSAP Spring Meeting 2024
Helping speed up development and manufacturing of 3D semiconductor devices with Japanese companies key goal for Finnish startup, with Kokusai Electric and Meidensha R&D projects already published. Joensuu, Finland/Tokyo, Japan – March 13, 2024 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, announces its participation in the 71st Japan Society of Applied Physics (JSAP) […]
Chipmetrics webinar: Insights to conformality modeling
Chipmetrics webinar: Insights to conformality modeling Chipmetrics recently hosted an enlightening webinar focused on insights to conformality modeling. Held on November 29, 2023, the webinar featured a detailed presentation by Professor Riikka Puurunen, the inventor of PillarHall test chips. Professor Puurunen, who is associated with the School of Chemical Engineering, Department of Chemical and Metallurgical […]
Webinar on “Unlocking the secrets of conformality, Plasma-Enhanced ALD”
Our enlightening webinar, “Unlocking the Secrets of Conformality: Plasma-Enhanced ALD,” featuring Professor Erwin Kessels, is now available for viewing on our YouTube channel. In this enlightening webinar, Professor Erwin Kessels presents about the conformality of plasma-enhanced ALD, addresses the importance of this kind of work and introduces the ALD growth regimes in 3D structures. In addition, […]
Chipmetrics’ pick-ups from ALD/ALE 2023: PillarHall in thin film conformality
The recent ALDALE 2023 conference in Bellevue witnessed the growing use of PillarHall chips in thin film conformality research. It was remarkable to see PillarHall applied to answer fundamental research questions and aid in the development of new process technologies for high aspect ratio challenges and 3D nanodevice applications. Here, we summarize our key pick-ups […]
