Join us for an exclusive Chipmetrics webinar featuring Prof. Dr. Ralf Tonner-Zech from Leipzig University, who will share his expertise on computational modelling in (Area Selective) Atomic Layer Deposition.
Topic: Computational Modelling of (AS-)ALD: From Fundamentals to Design Strategies
Date: 25 November 2025
Time: 5:00 PM CET
Speaker: Prof. Dr. Ralf Tonner-Zech, Theoretical Chemistry of Complex Matter, Faculty of Chemistry, Leipzig University
Chipmetrics is a leader in the semiconductor 3D metrology, offering cutting-edge solutions for process control through its innovative test chips and wafers.
Our core technologies provide a new perspective in measuring 3D thin films within high aspect ratio device architectures, enabling precise and rapid assessments crucial for development and manufacturing.
We specialize in assisting our clients to develop new materials, optimize deposition processes, and enhance overall yields, significantly accelerating their time to market.
