Chipmetrics webinar: Insights to conformality modeling

Chipmetrics webinar: Insights to conformality modeling

Chipmetrics recently hosted an enlightening webinar focused on insights to conformality modeling. Held on November 29, 2023, the webinar featured a detailed presentation by Professor Riikka Puurunen, the inventor of PillarHall test chips. Professor Puurunen, who is associated with the School of Chemical Engineering, Department of Chemical and Metallurgical Engineering at Aalto University, shared her valuable insights on “Recent Progress in Analysis of the Conformality of Film by Atomic Layer Deposition”.

The webinar also included an interactive Q&A session, where participants discussed various questions with Professor Puurunen. 

For those who missed the live event or wish to revisit the insightful discussions, the recording of the webinar is now available on the Chipmetrics’s Youtube channel. The Q&A session held during the live event was an exclusive feature for our attendees and, as such, is not included in the recorded version of the webinar.

Stay tuned for future updates, as we remain committed to bringing you the latest advancements and hosting more engaging events.

Chipmetrics

Chipmetrics is a leader in the semiconductor 3D metrology, offering cutting-edge solutions for process control through its innovative test chips and wafers.

Our core technologies provide a new perspective in measuring 3D thin films within high aspect ratio device architectures, enabling precise and rapid assessments crucial for development and manufacturing.

We specialize in assisting our clients to develop new materials, optimize deposition processes, and enhance overall yields, significantly accelerating their time to market.

Choose your preferred language