Metrology solution provider Chipmetrics to attend SEMICON West 2024

Finnish 3D metrology specialist to feature in Optoprofiler’s booth in San Francisco’s Moscone Center

Joensuu, Finland/San Francisco, USA – July 1st, 2024 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, announces its participation at SEMICON West 2024 in cooperation with distributor Optoprofiler. In Optoprofiler’s booth 164, visitors are invited to view the latest developments in 3D metrology solutions, such as the Chipmetrics PillarHall test chips.

“We are excited to showcase the PillarHall test device and our expanded metrology wafer family to SEMICON West attendees,” says Jenni Backholm, Head of U.S. Business Development at Chipmetrics. “Our goal is to help speed up development of next-gen chips and provide engineers with quick, accurate data needed for effective process iteration. Visit us at Optoprofiler’s booth to learn more about how you can improve your monitoring accuracy in a very cost-efficient way.”

With the semiconductor industry increasingly moving toward advanced packaging and 3D stacking, quicker ways to qualify film deposition processes means a competitive advantage on the market. To this end, Chipmetrics provides a full range of metrology products which allows for near instantaneous and non-destructive analysis of ALD (Atomic Layer Deposition) and CVD (Chemical Vapor Deposition) processes outputting accurate data.

“Accurate data in itself is crucial to success in developing new processes,” says Mikko Utriainen, CEO at Chipmetrics. “This is already true with traditional workflows, but with the semiconductor industry increasingly leaning on AI tools we should also remember that any AI is only as good as the data it has to work with.”

SEMICON West takes place in San Francisco’s Moscone Center, July 9–11. The 2023 edition of the show attracted over 10,000 attendees from 41 countries with 85% of visitors being linked to the semiconductor industry.

About Chipmetrics
Chipmetrics Oy develops and delivers metrology solutions for manufacturing processes for the semiconductor industry, focusing on innovative metrology chips and ALD measurement services. Its main product is the PillarHall® metrology chip for near-instantaneous thin film process conformality measurement. Founded in 2019, its head office is in Joensuu, Finland, with employees and sales partners in Japan, South Korea, USA, and Germany.

For more information, visit

Press contact:
Jonas Klar
Chipmetrics Oy
[email protected]
[email protected]

Editor’s note on ALD:
Atomic Layer Deposition (ALD) is a precision thin-film deposition technique crucial for semiconductor manufacturing, enabling the production of uniform and conformal layers essential for microelectronic devices. Through alternating exposure to precursor gases that react with the substrate in a self-limiting manner, ALD achieves atomic-level control over film thickness and composition. This method ensures exceptional uniformity across complex geometries, vital for the miniaturized, multi-layered structures such as the future’s 3D chips in advanced semiconductor devices, keeping Moore’s Law alive.

Finland plays a key role in the ALD landscape, having pioneered the process in the 1970s. Finland’s contribution to ALD includes significant advancements in materials science, equipment design, and the exploration of new applications ranging from electronics to renewable energy sectors. The country’s strong emphasis on research and development in nanotechnology has positioned it as a hub for ALD innovation, fostering collaborations between academia, industry, and research organizations worldwide.

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