Webinar on “Unlocking the secrets of conformality, Plasma-Enhanced ALD”

Our enlightening webinar, “Unlocking the Secrets of Conformality: Plasma-Enhanced ALD,” featuring Professor Erwin Kessels, is now available for viewing on our YouTube channel.

In this enlightening webinar, Professor Erwin Kessels presents about the conformality of plasma-enhanced ALD, addresses the importance of this kind of work and introduces the ALD growth regimes in 3D structures.

In addition, He discusses the latest research breakthroughs in both low-pressure plasma-enhanced ALD and atmospheric pressure plasma-enhanced spatial ALD in which the PillarHall test chips are employed.

Stay tuned for future updates, as we remain committed to bringing you the latest advancements and hosting more engaging events.

Chipmetrics

Chipmetrics is a leader in the semiconductor 3D metrology, offering cutting-edge solutions for process control through its innovative test chips and wafers.

Our core technologies provide a new perspective in measuring 3D thin films within high aspect ratio device architectures, enabling precise and rapid assessments crucial for development and manufacturing.

We specialize in assisting our clients to develop new materials, optimize deposition processes, and enhance overall yields, significantly accelerating their time to market.

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