Accelerating the applications of Atomic Layer Deposition (ALD)

Our expertise

We are a forerunner in productizing test structures, test chips, and wafer concepts for advanced materials and microelectronics manufacturing.
At Chipmetrics we provide innovative 3D ultra-high aspect ratio test elements for semiconductors and advanced material.

State of the art

High aspect ratio structures, new materials, and tighter geometries are challenges to semiconductor suppliers for process tools, materials, and inspection and test to meet the complex requirements of 3D.

Innovative Measurement Tools​

We provide productized test chips and their analysis expertise for demanding 3D applications of thin films.

3D Metrology made simple​​

Our experts help you to get conformality information fast and accurately.

Our company

Chipmetrics Ltd is ALD (Atomic Layer Deposition) technology company that provides innovative metrology solutions to accelerate 3D megatrends in semiconductors. Our main product – PillarHall test chip – is developed for advanced thin film process conformality characterization to accelerate applications of conformal 3D thin films.

Qualified operations


  • ISO 9001:2015 compliant. IC cleanliness certified
  • Country of origin: Finland, EU
  • Registered exporter FIREX31010316