Enhance Semiconductor Process Control Through Innovative Test Wafer Approaches Chipmetrics 300 mm pocket wafer approach enables innovative test structures for fast and accurate qualification of
Chipmetrics unveils 300 mm product line at APCM Europe 2024 The next evolution of metrology wafers and PillarHall will be demonstrated at the Chipmetrics booth
Chipmetrics from Finland to Attend JSAP Spring Meeting 2024 Helping speed up development and manufacturing of 3D semiconductor devices with Japanese companies key goal for
Chipmetrics Oy keräsi 2.4 miljoonan euron pääomarahoituksen 24.01.2024 – Joensuu, Suomi. Atomic Layer Deposition (ALD) teknologiaan erikoistunut yritys Chipmetrics Oy, joka on haastavien 3D metrologia
Chipmetrics Secures € 2.4 Million Seed Funding Round to Accelerate Product Innovation and Global Expansion. 24.01.2024– Joensuu, Finland Chipmetrics Ltd, the Atomic Layer Deposition (ALD)
Chipmetrics Joins Silicon Saxony: A New Era of Technological Synergy Chipmetrics has officially become a member of Silicon Saxony, one of Europe’s largest and most
Chipmetrics webinar: Insights to conformality modeling Chipmetrics recently hosted an enlightening webinar focused on insights to conformality modeling. Held on November 29, 2023, the webinar
Webinar on ” Unlocking the secrets of conformality, Plasma-Enhanced ALD Our enlightening webinar, “Unlocking the Secrets of Conformality: Plasma-Enhanced ALD,” featuring Professor Erwin Kessels, is now
MEIDENSHA uses PillarHall® Test Chip to develop Pure Ozone Generator for ALD applications. MEIDEN NANOPROCESS INNOVATIONS INC., located in Chiba, Japan, holds significant expertise in
The recent ALDALE 2023 conference in Bellevue witnessed the growing use of PillarHall chips in thin film conformality research. It was remarkable to see PillarHall
Conformality Research Competition 50th anniversary of ALD will be celebrated in AVS 24th International Conference on Atomic Layer Deposition (ALD 2024) in August 2024 in
Webinar on Metrology toolbox for ALD processing in high aspect ratio structures. Expert Insights and Innovative Solutions in Conformality Measurements for ALD Processes. We are
Kokusai Electric relies on patterned 3D substrates in thin film process metrology Kokusai Electric is one of the leading semiconductor thin film process equipment manufacturers
Chipmetrics Oy, Atomic Layer Deposition (ALD)-teknologiayritys ja ALD-prosessien mittaamiseen kehitettyjen tuotteistettujen 3D-testirakenteiden markkinajohtaja, on saanut päätökseen siemenrahoituskierroksensa. Sijoituskierrosta johti Redstone Pohjois-Karjalan pääomasijoitusrahastonsa kautta yhdessä neljän
05.09.2022 – Joensuu, Finland Chipmetrics Ltd, the ALD (Atomic Layer Deposition) technology company and the market leader of productized 3D ultra-high aspect ratio test elements