PillarHall test chips
PillarHall Lateral High Aspect Ratio (LHAR) Test Chip provides tremendous cost and time savings when compared to the state-of-art cross-sectional analyses. PillarHall provides fast and accurate conformality data source for revolutionizing 3D nanometrology and thin film process development methods.
Penetration depth and other process parameters can be calculated from digital microscopic image. We provide you analyser software and instructions how to take quality pictures with your microscope.