Products and Services

PillarHall test chips

PillarHall Lateral High Aspect Ratio Silicon Test Chip

Chipmetrics VHAR1

Chipmetrics Vertical High Aspect Ratio (VHAR1) test chip

Pocket Wafer

Measurement service

Chipmetrics 3D Metrology Service

ASD test chip

Area Selective Deposition (ASD-1) Test Chip

Chipmetrics

Chipmetrics is a leader in the semiconductor 3D metrology, offering cutting-edge solutions for process control through its innovative test chips and wafers.

Our core technologies provide a new perspective in measuring 3D thin films within high aspect ratio device architectures, enabling precise and rapid assessments crucial for development and manufacturing.

We specialize in assisting our clients to develop new materials, optimize deposition processes, and enhance overall yields, significantly accelerating their time to market.

Qualified operations

ISO 9001:2015 compliant. IC cleanliness certified
Country of origin: Finland, EU
Registered exporter FIREX31010316

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