Webinar on “Metrology Toolbox for ALD Processing in High Aspect Ratio Structures.
Webinar on Metrology toolbox for ALD processing in high aspect ratio structures. Expert Insights and…
Kokusai Electric relies on patterned 3D substrates in thin film process metrology
Kokusai Electric relies on patterned 3D substrates in thin film process metrology Kokusai Electric is…
Chipmetrics Oy:n siemenrahoituskierros päätökseen
Chipmetrics Oy, Atomic Layer Deposition (ALD)-teknologiayritys ja ALD-prosessien mittaamiseen kehitettyjen tuotteistettujen 3D-testirakenteiden markkinajohtaja, on saanut…
Chipmetrics announces completion of the seed investment round
05.09.2022 – Joensuu, Finland Chipmetrics Ltd, the ALD (Atomic Layer Deposition) technology company and the…