Chipmetrics Secures 1 Million Euro in Funding from Business Finland
Finnish startup becomes one of the first semiconductor company to receive funding from the Young Innovative Company funding program, will accelerate international business development efforts. Helsinki, Finland – 6 November 2024 – Chipmetrics Oy, a pioneering leader in 3D thin film semiconductor metrology, announces that it has been awarded 1 million euro from Business Finland’s […]
Chipmetrics announces ALD 2024 Academia Contest Winners
Finnish 3D thin film semiconductor metrology specialist rounds up a successful ALD/ALE 2024 conference by announcing international contest winners. Joensuu/Helsinki, Finland – August 23rd, 2024 – Chipmetrics Oy, a leading provider of metrology solutions for the semiconductor industry, announces the winner of its global conformality research competition, held in collaboration with international academic institutions. The […]
Chipmetrics at SEMICON Taiwan
Finnish 3D thin film semiconductor metrology specialist to bring its solutions to the Taiwanese semiconductor industry Joensuu, Finland/Taipei, Taiwan – August 21th, 2024 – Chipmetrics Oy, a leading provider of metrology solutions for the semiconductor industry, announces its participation at SEMICON Taiwan, held September 3–6. With it, Chipmetrics will bring its latest metrology solutions, including its […]
Chipmetrics at ALD2024
Finnish 3D thin film semiconductor metrology specialist to feature heavily at ALD/ALE 2024, celebrating the 50th year of ALD. Joensuu/Helsinki, Finland – July 25th, 2024 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, announces its presence and activities at the ALD/ALE 2024 conference, to be held in Helsinki, August 4–7. The event will […]
PillarHall LHAR Structures at the Forefront of ALD/ALE2024 Conference
The ALD/ALE2024 conference is showcasing the PillarHall Lateral High Aspect Ratio (LHAR) test structure in numerous pivotal presentations this year. This trend underscores the importance and versatility of PillarHall structure in pushing the boundaries of conformality research and ALD technology. Key Presentations Featuring PillarHall Structures Unveiling ALD Reaction MechanismsDr. Jussi Kinnunen will discuss the influence […]
Chipmetrics Launches New Test Chips for Advanced Atomic Layer Processes
Finnish 3D thin film semiconductor metrology specialist launches new PillarHall LHAR5 test chip with 100 nanometer gap height, complements its metrology solution with new ASD-1 chip for Area Selective Deposition. Joensuu, Finland – July 15th, 2024 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, announces the launch of two new test chips, the […]
Metrology solution provider Chipmetrics to attend SEMICON West 2024
Finnish 3D metrology specialist to feature in Optoprofiler’s booth in San Francisco’s Moscone Center Joensuu, Finland/San Francisco, USA – July 1st, 2024 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, announces its participation at SEMICON West 2024 in cooperation with distributor Optoprofiler. In Optoprofiler’s booth 164, visitors are invited to view the latest […]
Seasoned Semiconductor Professionals Appointed to Chipmetrics’ Board of Directors
Joensuu, Finland – June 5, 2024 Chipmetrics is proud to announce the appointment of two experienced semiconductor professionals, Jukka Nieminen and Satu Lipponen, to its Board of Directors. Their extensive experience and fresh perspectives are expected to drive Chipmetrics towards becoming a leading semiconductor metrology company. Jukka Nieminen, former CEO of Beneq, joins the board […]
Puolijohdealan ammattilaisia nimitetty Chipmetrics Oy:n hallitukseen
Joensuu, Suomi – 5. kesäkuuta 2024 Chipmetrics Oy on nimittänyt kaksi kokenutta puolijohdealan ammattilaista, Jukka Niemisen ja Satu Lipposen, hallitukseensa. Heidän laaja-alainen kokemuksensa teollisuudesta ja näkemyksensä odotetaan siivittävän Chipmetricsin kohti johtavaa asemaa puolijohdealan metrologiasegmentissä. Jukka Nieminen, Beneqin entinen toimitusjohtaja, liittyy hallitukseen mukanaan mittava kokemus atomikerroskasvatuslaitteiden (ALD) liiketoiminnasta puolijohdeteollisuudessa. Hänen nykyinen asemansa mahdollistaa itsenäisten strategisten visioiden […]
PillarHall for exploring the reaction mechanism beyond the conventional conformality measurements
In the fast-paced world of semiconductor manufacturing, the demand for precision and perfection has never been higher. At the heart of this industry’s evolution is the atomic layer deposition (ALD) technique, a critical process for achieving conformal coatings essential for the latest semiconductor technologies. While traditional thermal-ALD has its merits, it’s often limited by high […]