Challenges of Transferring Deposition Processes to Industry Partners in the Semiconductor Industry

The ongoing struggle to uphold Moore’s law leads to increasing scaling demands for semiconductor device structures. In order to facilitate these needs the introduction of 3D structures has been accelerated by the industry. This is especially evident in 3D NAND memory structures, Though Silicon Vias (TSVs) and new transistor architectures like nanosheet designs. All of […]
Streamline Semiconductor Tool Qualification with PillarHall Test Chips

Staying competitive hinges on getting new tools up and running as quickly and efficiently as possible, be it brand new tools or after maintenance. Yet, the qualification process for deposition equipment can be a major bottleneck – one that often involves lengthy cycles, costly materials, and complex data analysis. Our PillarHall series of test chips […]
Chipmetrics Expands Thin Film Measurement Capabilities with Support from ELY

Investment in new equipment and research to drive innovation in 3D semiconductor structures Chipmetrics Oy is scaling new heights with significant support from the ELY, the Finnish Centre for Economic Development, Transport and the Environment. The company’s latest project PAKKA, running from January 2024 to June 2025, focuses on expanding its service offering by enhancing […]
The PillarHall® LHAR5 and Advanced Semiconductor Process Control

In today’s fast-paced semiconductor industry, the margin for error continues to shrink with each new device node. At the same time, competition is fiercer than ever, driving the need for faster tool qualification, higher yield, and more sustainable production processes. That’s why we’re excited to introduce the fifth generation PillarHall test chip, LHAR5 – a […]
Chipmetrics Profiles: Professor Henrik Pedersen, Linköping University

Photo: Olov Planthaber, Linköping University
Chipmetrics Receives ELY Grant for Pocket Wafer Development

The Finnish Centre for Economic Development, Transport and the Environment awards semiconductor metrology experts more than 300,000 euro for business and product development. Joensuu, Finland – January 20, 2025 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, announces the receipt of regional grants from the Finnish Centre for Economic Development, Transport […]
Chipmetrics Establishes Dresden-Based Subsidiary

Dresden, Germany – January 13, 2025 –Chipmetrics is proud to announce its new Dresden-based German subsidiary, Chipmetrics GmbH. Originally hailing from Finland’s Joensuu, 2025 is set to be an important year for the company as it aims to aggressively scale both sales and marketing of its 3D semiconductor metrology products. Especially important is Chipmetrics’ tool […]
Chipmetrics to Premiere PillarHall LHAR5 Test Chips for Japanese Clients at SEMICON Japan

Finnish 3D semiconductor metrology expert aims to deepen relationships with Japanese companies at SEMICON Japan 2024 trade show. Joensuu, Finland/Tokyo, Japan – December 5th, 2024 – Chipmetrics Oy, an innovative metrology solutions provider to the semiconductor industry, announces its participation at SEMICON Japan to be held December 11–13 in Tokyo. At SEMICON Japan, Chipmetrics will […]
Chipmetrics Secures 1 Million Euro in Funding from Business Finland

Finnish startup becomes one of the first semiconductor company to receive funding from the Young Innovative Company funding program, will accelerate international business development efforts. Helsinki, Finland – 6 November 2024 – Chipmetrics Oy, a pioneering leader in 3D thin film semiconductor metrology, announces that it has been awarded 1 million euro from Business Finland’s […]
Chipmetrics announces ALD 2024 Academia Contest Winners

Finnish 3D thin film semiconductor metrology specialist rounds up a successful ALD/ALE 2024 conference by announcing international contest winners. Joensuu/Helsinki, Finland – August 23rd, 2024 – Chipmetrics Oy, a leading provider of metrology solutions for the semiconductor industry, announces the winner of its global conformality research competition, held in collaboration with international academic institutions. The […]