Chipmetrics announces new ASD-2 test chip with customizable metal–dielectric material stacks
Chipmetrics is expanding its Area-Selective Deposition test chip portfolio with ASD-2, a new multi-material test chip platform designed to help semiconductor process teams evaluate selective deposition on advanced metal–dielectric surfaces. Building on the foundation of the ASD-1 test chip, ASD-2 introduces a more flexible approach to ASD process development: a variable material stack that can […]
